Semiconductor Test and Device Characterization

Students will explore fundamental principles and practical applications of electrical testing for semiconductor devices, from discrete components to integrated circuits. The curriculum covers various test equipment, parametric and functional testing, fault isolation strategies, and industry standards. Upon completion, students will be proficient in interpreting test data, troubleshooting common device failures, and applying characterization methods to ensure product reliability and optimize manufacturing processes within the semiconductor industry. This course prepares students for roles in quality control, test engineering, and product development.

Prerequisites

SET 115 SET 240

Course outline

Lectures, virtual labs, and graded assignments — completed in your browser.

01Foundations of Device Testinglecture

02Measuring Key Electrical Characteristicslecture

03Direct Current Parameter Verificationlecture

04Alternating Current Response Analysislecture

05On-Wafer Probing and Test Procedureslecture

06Understanding Automated Test Platformslecture

07Creating and Debugging Test Programslecture

08Ensuring Long-Term Device Reliabilitylecture

09Diagnosing Device Malfunctionslecture

10Monitoring and Controlling Manufacturing Processeslecture

11Examining Material and Optical Propertieslecture

12Characterization for Future Technologieslecture

13Interpreting Test Data for Yield Improvementlecture

14Integrated Device Performance Evaluationlecture

Syllabus

Week 1: Introduction to Semiconductor Test and Characterization
Week 2: Basic Electrical Measurement Principles
Week 3: Parametric Testing of Semiconductor Devices
Week 4: DC and AC Characterization Techniques
Week 5: Semiconductor Test Equipment and Instrumentation
Week 6: Wafer Sort and Die-Level Testing
Week 7: Package-Level Testing and Burn-In
Week 8: Functional Testing of Integrated Circuits
Week 9: Fault Models and Diagnosis
Week 10: Statistical Process Control for Testing
Week 11: Reliability Testing and Failure Analysis
Week 12: Advanced Characterization Techniques
Week 13: Test Data Analysis and Reporting
Week 14: Industry Standards and Future Trends in Semiconductor Testing